Optical Long-Baseline Interferometry

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In the quest to look ever closer at astronomical objects, optical long-baseline interferometry has become a standard tool for astronomers. It can achieve spatial resolutions exceeding that of even the largest telescope. Offered at major observatories where... Viac o knihe

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O knihe

In the quest to look ever closer at astronomical objects, optical long-baseline interferometry has become a standard tool for astronomers. It can achieve spatial resolutions exceeding that of even the largest telescope. Offered at major observatories where interferometric instruments provide high spatial resolution often combined with spectral information, optical long-baseline interferometry allows for the detailed study of astronomical objects and processes in their environment. The author Peter A. Schuller introduces the basic concepts of optical long-baseline interferometry and uses the example of a particular instrument to illustrate various aspects in the development and the operation of an astronomical interferometer. Focus is put on the calibration of the instrument both in the laboratory and during observations. The potential of astronomical interferometry is highlighted by a study in which interferometric data is used to constrain computer models of astronomical objects. This book is aimed at readers with some background in science and engineering seeking a brief introduction to optical long-baseline interferometry in concept, implementation and application.

  • Vydavateľstvo: VDM Verlag
  • Formát: Paperback
  • Jazyk:
  • ISBN: 9783836491709

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