- Anglický jazyk
Resonant X-Ray Scattering in Correlated Systems
Autor: Sumio Ishihara
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal... Viac o knihe
Na objednávku, dodanie 2-4 týždne
125.83 €
bežná cena: 142.99 €
O knihe
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
- Vydavateľstvo: Springer Berlin Heidelberg
- Rok vydania: 2017
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9783662532256