-
Anglický jazyk
Ultra thin film deposition and Evaluation Using SAM
Autor: Annemarie Balutiu
In the present investigation a combination of two techniquest: a classic one for the deposition of ultra thin films (i.e., electroless deposition) and a complementary non-destructive (NDE) technique for quality evaluation of the deposited films have been... Viac o knihe
Na objednávku
53.68 €
bežná cena: 56.50 €
O knihe
In the present investigation a combination of two techniquest: a classic one for the deposition of ultra thin films (i.e., electroless deposition) and a complementary non-destructive (NDE) technique for quality evaluation of the deposited films have been used for nickel-cobalt ultra thin films. The present research project focuses on the application of a nondestructive method (i.e., scanning acoustic microscopy (SAM) to evaluate the quality of nickel cobalt ultra thin films grown on a dielectric substrate. The developed method is useful for further improvement of designing and manufacturing of the films. Visualizing micro cracks and delaminations provide information about adhesion within thin films system.
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2020
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9786139850112
Nemecký jazyk 
