-
Anglický jazyk
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Autor: Andrei Pavlov
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware... Viac o knihe
Na objednávku
167.19 €
bežná cena: 175.99 €
O knihe
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
- Vydavateľstvo: Springer Nature B.V.
- Rok vydania: 2008
- Formát: Hardback
- Rozmer: 242 x 166 mm
- Jazyk: Anglický jazyk
- ISBN: 9781402083624
Nemecký jazyk 
