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Anglický jazyk
Measurement Techniques for Radio Frequency Nanoelectronics
Autor: T. Mitch Wallis
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.
Viac o kniheNa objednávku
145.26 €
bežná cena: 161.40 €
O knihe
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.
- Vydavateľstvo: Cambridge University Press
- Rok vydania: 2017
- Formát: Hardback
- Rozmer: 250 x 175 mm
- Jazyk: Anglický jazyk
- ISBN: 9781107120686
Nemecký jazyk