• Anglický jazyk

Measurement Techniques for Radio Frequency Nanoelectronics

Autor: T. Mitch Wallis

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.

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O knihe

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.

  • Vydavateľstvo: Cambridge University Press
  • Rok vydania: 2017
  • Formát: Hardback
  • Rozmer: 250 x 175 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9781107120686

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