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Anglický jazyk
Test and Diagnosis for Small-Delay Defects
Autor: Mohammad Tehranipoor
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book... Viac o knihe
Na objednávku
104.49 €
bežná cena: 109.99 €
O knihe
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
- Vydavateľstvo: Springer
- Rok vydania: 2011
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9781441982964
Nemecký jazyk 
