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Anglický jazyk
X-Ray Line Profile Analysis in Materials Science
Autor: Jen¿ Gubicza
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments... Viac o knihe
Na objednávku
210.43 €
bežná cena: 221.50 €
O knihe
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
- Vydavateľstvo: Engineering Science Reference
- Rok vydania: 2014
- Formát: Hardback
- Rozmer: 260 x 183 mm
- Jazyk: Anglický jazyk
- ISBN: 9781466658523
Nemecký jazyk 
